Приказано Учитељски факултет за аутора "Danković, Danijel"
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Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method
Mitrović, Nikola; Danković, Danijel; Ranđelović, Branislav; Prijić, Zoran; Stojadinović, Ninoslav (МИДЕМ друштво, Словенија, 2020)Negative bias temperature instability (NBTI) is a phenomenon commonly observed in p-channel metal-oxide semiconductor (MOS) devices simultaneously exposed to elevated temperature and negative gate voltage. This paper studies ...